NIAR Electromagnetic Effects Lab at Wichita State University

Section 19 – Induced Signal Susceptibility

Purpose of the Test

This test determines whether the equipment interconnect circuit configuration will accept a level of induced voltages caused by the installation environment. This section relates specifically to interfering signals related to the power frequency and its harmonics, audio frequency signals, and electrical transients that are generated by other on board equipment or systems and coupled to sensitive circuits within the EUT through its interconnecting wiring. Power leads tested under section 18 are exempt from this test.

The tests in this section are “susceptibility” tests, meaning the units being tested are the “victims” of the environment.

Our facilities have full DO-160G capability for categories C, Z, A, and B

Our facilities include three 50 kHz DC, 100Amp Peak Power Techron Amplifiers

Photos and Video

Description Video

References and Related Documents



Matthew Wills (316) 978-5776
Andrew Nguyen (316) 765-4255
Wichita State University
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